GS-191-FA-1045 Rotary Reflectance Measurement System
This fully automatic reflection measurement system simultaneously determines the spectral and colarimetric reflection data at 0° and 45° angles of incidence. The substrates are measured one after the other on a rotating table. The samples consist of coated glass, polished surfaces or diffusely reflecting surfaces. The thickness must be at least 500 µm. The system typically requires 200 ms per measuring point.
Using a high-precision spectrometer, both the reflection index and the coating thickness are determined with industrial accuracy, reproducibility and dysentery.