Standard and high-resolution Fizeau interferometers
Hardware
Fizeau interferometers are often used to exactly measure the surface characteristics of optics such as lenses or mirrors. The development team of Äpre Instruments
The development team at Äpre Instruments can rely on decades of experience in the interferometer industry and has put all the knowledge gained into the development of its own modern Fizeau interferometers and light sources.
In the devices of theS series the optical bench is completely separated from the electronics board. State-of-the-art digital cameras are used both for aligning the optical axis and for measuring the surface. The image resolution can be configured up to 9 megapixels. Communication with the PC takes place via USB3.
Software Reveal
Not only the hardware but also the software comes completely from Äpre Instruments. In digital interferometry, the software for controlling and evaluating the data is at least as important and decisive as the hardware. The software developers at Äpre Instruments have therefore worked for years to write software that is as user-friendly as possible for use in optics manufacturing and at the same time extremely powerful.
View software
Spectral Controlled Interferometry
All standard and high-resolution Fizeau interferometers from Äpre Instruments are equipped with a frequency-stabilized SLM 633 nm HeNe laser. The measurement technique can be carried out using either traditional phase shift, vibration-tolerant phase shift or the vibration-insensitive carrier fringe method. In addition, each interferometer can be connected to Äpre Instruments’ own specially developed light source, which can be used to measure different surfaces separately using the so-called SCI technology (Spectrally Controlled Interferometry).
View SCI light source
For more in-depth reading on the subject, we recommend this article.
The following models for standard resolution and high resolution are available:
S-Series |SR Standard resolution universal interferometers | |||
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Model | S50 | SR | S100 | SR | S150 | SR |
Aperture | 51 mm | 102 mm | 153 mm |
Data acquisition modes | Laser: Vibration Tolerant PSI (Standard) Laser: Vibration Insensitive using Spatial-Carrier Fringe Acquisition Laser: Wavelength Modulated PSI (Option) Low Coherence: Spectrally Controlled Interferometry (Option) |
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Camera resolution | 1022 x 1022 | 1022 x 1022 | 1022 x 1022 |
Image resolution | 100 µm | 200 µm | 300 µm |
Fringe resolution | 300 fringes/aperture | ||
Retrace error | λ/15 optional: λ/20 | λ/15 optional: λ/20 | λ/15 optional: λ/20 |
S-Series | 1MP - General performance Fizeau interferometer |
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Model | S50 | 1MP | S100 | 1MP | S150 | 1MP |
Output diameter | 51 mm (2 inch) | 102 mm (4 inch) | 153 mm (6 inch) |
Data acquisition modes | Laser: Vibration Tolerant PSI (Standard) Laser: Vibration Insensitive using Spatial-Carrier Fringe Acquisition Laser: Wavelength Modulated PSI (Option) Low Coherence: Spectrally Controlled Interferometry (Option) |
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Camera resolution | 2044 x 2044 | 2044 x 2044 | 2044 x 2044 |
Image resolution | 50 µm | 100 µm | 150 µm |
Fringe resolution | >600 fringes/aperture | >600 fringes/aperture | >600 fringes/aperture |
Retrace error | λ/15 optional: λ/20 | λ/15 optional: λ/20 | λ/15 optional: λ/20 |
S-Series |HRx Very high-resolution interferometers | |||
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Model | S50 | HRx | S100 | HRx | S150 | HRx |
Aperture | 51 mm | 102 mm | 153 mm |
Data acquisition modes | Laser: Vibration Tolerant PSI (Standard) Laser: Vibration Insensitive using Spatial-Carrier Fringe Acquisition Laser: Wavelength Modulated PSI (Option) Low Coherence: Spectrally Controlled Interferometry (Option) |
||
Camera resolution | 3000 x 3000 | 3000 x 3000 | 3000 x 3000 |
Image resolution | 35 µm | 70 µm | 105 µm |
Fringe resolution | >600 fringes/aperture | >600 fringes/aperture | >600 fringes/aperture |
Retrace error | λ/15 optional: λ/20 | λ/15 optional: λ/20 | λ/15 optional: λ/20 |