Surface analysis in nm resolution: OptiQuiver

The OptiQuiver is a very universal optical measuring instrument and works with practically all types of optical radiation. The sources can be narrowband and highly coherent, such as lasers, but also broadband such as LEDs or white light sources. Furthermore, the radiation can be divergent, collimated or focused. An internal broadband light source is also available. The system determines the absolute phase shift with spatial resolution, which enables a high dynamic range and has a measuring rate of approx. 2 Hz.

The OptiQuiver can therefore characterize surfaces and optics, measure beam profiles, AOIs and divergence angles, track wandering focal points, etc. In the basic version an aperture of 48 mm is currently available.


  • Monitoring and control of adaptive optics (mirrors and lenses)
  • Measurement of shape (PV) and surface roughness of planar and non-planar mirrors
  • Measuring the shape and imaging quality of optical lenses
  • Measurement of the concentricity of bearings (wobble measurement)
  • Automated beam alignment in X and Y axis
  • Checking and adjusting the optical path in optical test setups
  • High-resolution optical wavefront measurement
  • Measurement of the homogeneity of the irradiation on a surface
  • Measurement of the deformation of semiconductor wafers
  • Measurement of the beam shape and beam quality of lasers, LEDs and white light sources
  • Qualification of prescription lenses and contact lenses


  • Quartus Engineering as an experienced house for customized application software provides an outstanding user interface. (compatible with Windows and MacOS)
  • 2D and 3D wavefront diagrams with high dynamic range, Zernike decomposition, residual error, angle tilt and beam profile
  • The removable reference mirror in the kinematic lens cap enables a self-test (audit mode) for function control at any time
  • Large input aperture for measuring beams and reflective surfaces, without additional beam condenser/expander
  • Interactive plotting tools with live point tracking and user-selectable color scales
  • Control functions for the internal light source
  • Input function for all operation parameters (gain, wavelength, etc.)
  • Long-term function for virtually all functions
  • Recording function of live measurements for later offline analysis
  • Temperature compensation for mobile use
  • Compact size and storage in a carry-on case for remote inspection and easy transportation
  • APIs for OEM integration (gRPC via Python, C++, Matlab)
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    Standard specifications and configurations

    Optical Specs
    Aperture diameter2548100mm
    Integrated light sourceLED, RG1 (Low risk group) per IEC-62471:2006
    Internal beam wavelength550nm
    Mask pitch350500500µm
    Mask aperture diameter200250250µm
    Mask EFL757575mm
    Active mask apertures656876687668
    Minimum beam diameter335mm
    Sensor Specs
    Detector range400 - 750 400 - 750400 - 750nm
    Resolution4024 x 30365472 x 36485472 x 3648pix
    Pixel pitch1.852.42.4µm
    Bit depth8 Bit8 Bit8 Bit
    Measurement Specs
    Max tilt> 4> 6> 8deg
    Tilt accuracy< 0.5< 1< 1arcsec
    Tilt resolution< 0.25< 0.5< 0.5arcsec
    Wavefront accuracy (RMS)253050nm
    Wavefront sensitivity (RMS)101525nm
    Wavefront dynamic range> 1> 1.5> 2mm
    General Specs
    USB interfaceUSB 3.0 type A
    Frame rate4 - 202 - 102 - 10Hz
    Power supply24 V, 1.5 A max
    Overvoltage categoryOVII
    Pollution degreePD1
    Operating temperature10 to 30°C
    Operating humidity10 to 85%, None condensingRH
    Storage temperature-10 to 50°C