GS-191-SA-1045 Semi-Auto Reflectance Measurement System

This semi-automatic reflection measurement system simultaneously and automatically determines complete spectral and colorimetric reflection data at 0° and 45° angles of incidence. Typical surfaces are coated glass, polished surfaces or diffuse scattering surfaces. The substrate must be at least 500 µm thick. The scanning time per measuring point is approx. 200 ms.

Thanks to Gamma Scientific’s high-precision spectroradiometric measurement technology, the GS-191-SA-1045 is able to guarantee industrial accuracy, reproducibility and throughput for determining both the reflection index and the coating thickness.

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