Speckle interferometer for vibration analysis up to 20 MHz

The Modulo Uno is a streamlined speckle-interferometer for vibration analysis based on Multi-Channel Random Quadrature technology. This technology uses the scattering effect of less reflective surfaces to capture as many laser speckles as possible.

The combined probe beam, consisting of the reflected beam from the sample and the reference beam, is directed onto a single detector array that detects both the vertically and horizontally polarized components. The innovative optical design of the Modulo Uno avoids the need to split the sample beam for processing, allowing the Modulo Uno to operate efficiently with a low power laser. This not only reduces construction costs, but also allows sensitive materials such as composites to be directly analyzed, making it particularly suitable for biomedical applications.

The Modulo Uno can measure a bandwidth of 20 MHz.
In addition to the standard analog output, the Modulo Uno also has a digital output so that it can be connected directly to a computer via an Ethernet cable. It has a resolution of 8 bits and a sampling rate of 125 Ms/s.

Features

  • Very robust, as no high-precision optical components or positioning are required
  • Detector head is fiber-coupled and can therefore be mounted almost anywhere
  • Both analog and digital output signal proportional to the surface displacement
  • High sensitivity on all types of surfaces and materials
  • Independent of the wavelength of the laser

Specifications Modulo Uno and Modulo Quatro

Modulo UnoModulo Quatro
TechnologyMulti-Channel Random QuadratureMulti-Channel Random Quadrature
DetectionOut-Of-PlaneOut-Of-Plane and or 3D
ConfigurationOptical FiberOptical Fiber
Laser Output30 – 100 mW400mW to 3W
NESD (out-of-plane motion)Varies based on model specifications.Varies based on model specifications.
Detection bandwidthUp to 20 MHzUp to 60 MHz
Dimensions400 x 170 x 165 mm490 x 450 x 170 mm
Weight6.5 kg18 kg
Electrical requirements110V / 220V
50Hz / 60Hz
110V / 220V
50Hz / 60Hz

Application example:
Piezo transducer characterization showing non-uniform surface displacement

Visible non-uniform surface displacement
  • Direct laser ultrasonic measurement
  • 5MHz Piezo with pulse excitation (50Vpp)
  • ≈ 4nm peak-to-peak surface displacement
  • Modulo: 30mW laser output with a wavelength of 1064 nm; NESD* on Piezo: ~ 5∙10-5nm/Hz1/2